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Scientific Productions
ACS Applied Materials & Interfaces [American Chemical Society], Volume: 16 Issue: 27 Pages: 35825-35833
Journal of Materials Chemistry C [Royal Society of Chemistry],
Materials Advances [Royal Society of Chemistry], Volume: 5 Issue: 9 Pages: 3992-3997
Electrochemical Society Meeting Abstracts 244 [The Electrochemical Society, Inc.], Issue: 30 Pages: 1552-1552
Electrochemical Society Meeting Abstracts 244 [The Electrochemical Society, Inc.], Issue: 30 Pages: 1536-1536
Phosphorus activation in silicon: To deglaze or not to deglaze, that is the question
Materials Science in Semiconductor Processing [Pergamon], Volume: 165 Pages: 107691
Materials Science in Semiconductor Processing [Pergamon], Volume: 163 Pages: 107548
ACS Applied Polymer Materials [American Chemical Society], Volume: 4 Issue: 10 Pages: 7191-7203
ACS Applied Nano Materials [American Chemical Society], Volume: 5 Issue: 7 Pages: 9818-9828
Silicon Doping by Polymer Grafting: Size Distribution Matters
ACS Applied Polymer Materials [American Chemical Society], Volume: 3 Issue: 12 Pages: 6383-6393
Journal of Materials Chemistry C [Royal Society of Chemistry], Volume: 9 Issue: 11 Pages: 4020-4028
Toward Deterministic Doping of Silicon via Dopant Containing Homopolymer
Bulletin of the American Physical Society [American Physical Society], Volume: 65
Hexagonal pattern coarsening in cylinder-forming PS-b-PMMA block copolymer thin films
Bulletin of the American Physical Society [American Physical Society], Volume: 65
Doping of Silicon by Phosphorus End-Terminated Polymers: Drive-in and Activation of Dopants
Journal of Materials Chemistry C [Royal Society of Chemistry], Volume: 8 Issue: 30 Pages: 10229-10237
Thermodynamic and ordering kinetics in asymmetric PS-b-PMMA block copolymer thin films
Soft Matter [Royal Society of Chemistry],
Thermodynamics and ordering kinetics in asymmetric PS-b-PMMA block copolymer thin films
Soft Matter [Royal Society of Chemistry], Volume: 16 Issue: 23 Pages: 5525-5533
Thermodynamic and ordering kinetics in asymmetric PS-b-PMMA block copolymer thin films
arXiv preprint arXiv:1912.08120 [],
Advanced Materials Interfaces [], Volume: 6 Issue: 12 Pages: 1900503
Advanced Materials Interfaces [], Volume: 5 Issue: 20 Pages: 1801016
Hierarchical Order in Dewetted Block Copolymer Thin Films on Chemically Patterned Surfaces
ACS nano [American Chemical Society], Volume: 12 Issue: 7 Pages: 7076-7085
Physical Review Materials [American Physical Society], Volume: 2 Issue: 5 Pages: 055605
physica status solidi (a) [], Volume: 215 Issue: 6 Pages: 1870010
physica status solidi (a) [], Volume: 215 Issue: 6 Pages: 1700866
physica status solidi (a) [], Volume: 215 Issue: 6 Pages: 1700866
ACS nano [American Chemical Society], Volume: 12 Issue: 1 Pages: 178-186
ACS nano [American Chemical Society], Volume: 12 Issue: 1 Pages: 178–186
Electronic band structures of undoped and P-doped Si nanocrystals embedded in SiO 2
Journal of Materials Chemistry C [Royal Society of Chemistry], Volume: 6 Issue: 1 Pages: 119-126
arXiv preprint arXiv:1711.10944 [],
Journal of analytical and applied pyrolysis [Elsevier], Volume: 128 Pages: 238-245
Influence of Block Copolymer feature size on Reactive Ion Etching pattern transfer into silicon.
Nanotechnology [IOP Publishing], Volume: 28 Issue: 40 Pages: 404001
Toward Lateral Length Standards at the Nanoscale Based on Diblock Copolymers
ACS applied materials & interfaces [American Chemical Society], Volume: 9 Issue: 18 Pages: 15685-15697
Towards Lateral Length Standards at the Nanoscale Based on DiBlock Copolymers
ACS Applied Materials & Interfaces [American Chemical Society],
GISAXS Analysis of the In-Depth Morphology of Thick PS-b-PMMA Films
ACS applied materials & interfaces [American Chemical Society], Volume: 9 Issue: 12 Pages: 11054-11063
GISAXS analysis of the in-depth morphology of thick PS-b-PMMA films
ACS Appl. Mater. Interfaces [], Volume: 9 Pages: 11054-11063
Cover Image, Volume 66, Issue 3
Polymer International [John Wiley & Sons, Ltd], Volume: 66 Issue: 3 Pages: i-i
Polymer International [John Wiley & Sons, Ltd], Volume: 66 Pages: 459-467
Molecular Systems Design & Engineering [Royal Society of Chemistry], Volume: 2 Issue: 5 Pages: 581-588
Nanoscale [Royal Society of Chemistry], Volume: 9 Issue: 43 Pages: 16981-16992
Electronic Band Structure of undoped and P-doped Si Nanocrystals embedded in SiO 2
Journal of Materials Chemistry C [Royal Society of Chemistry],
Polymer International [John Wiley & Sons, Ltd], Volume: 66 Issue: 3 Pages: 459–467
Nanoscale control of Si nanoparticles within a 2D hexagonal array embedded in SiO2 thin films
Nanotechnology [IOP Publishing], Volume: 28 Issue: 1 Pages: 014001
Ozone-Based Sequential Infiltration Synthesis of Al2O3 Nanostructures in Symmetric Block Copolymer
ACS applied materials & interfaces [American Chemical Society], Volume: 8 Issue: 49 Pages: 33933-33942
Self-assembly strategies for the synthesis of functional nanostructured materials
La Rivista del nuovo Cimento [Società Italiana di Fisica], Volume: 39 Pages: 279-312
Neutral wetting brush layers for block copolymer thin films using homopolymer blends
AIP Conference Proceedings [AIP Publishing LLC], Volume: 1736 Issue: 1 Pages: 020169
Surface engineering with functional random copolymers for nanolithographic applications
AIP Conference Proceedings [AIP Publishing LLC], Volume: 1736 Issue: 1 Pages: 020170
Analytical and bioanalytical chemistry [Springer Berlin Heidelberg], Volume: 408 Issue: 12 Pages: 3155-3163
ACS applied materials & interfaces [American Chemical Society], Volume: 8 Issue: 15 Pages: 9897-9908
ACS applied materials & interfaces [American Chemical Society], Volume: 8 Issue: 12 Pages: 8280-8288
Synthesis and characterization of P δ-layer in SiO2 by monolayer doping
Nanotechnology [IOP Publishing], Volume: 27 Issue: 7 Pages: 075606
Modeling of phosphorus diffusion in silicon oxide and incorporation in silicon nanocrystals
Journal of Materials Chemistry C [Royal Society of Chemistry], Volume: 4 Issue: 16 Pages: 3531-3539
RSC advances [Royal Society of Chemistry], Volume: 6 Issue: 5 Pages: 3617-3622
ACS applied materials & interfaces [American Chemical Society], Volume: 7 Issue: 42 Pages: 23615-23622
Nanotechnology [IOP Publishing], Volume: 26 Issue: 41 Pages: 415603
Ultrathin random copolymer-grafted layers for block copolymer self-assembly
ACS applied materials & interfaces [American Chemical Society], Volume: 7 Issue: 20 Pages: 10944-10951
Nanotechnology [IOP Publishing], Volume: 26 Issue: 21 Pages: 215301
Resistive switching in high-density nanodevices fabricated by block copolymer self-assembly
ACS nano [American Chemical Society], Volume: 9 Issue: 3 Pages: 2518-2529
Thermal Stability of Functional P (Sr-MMA) Random Copolymers for Nanolithographic Applications
ACS applied materials & interfaces [American Chemical Society], Volume: 7 Issue: 7 Pages: 3920-3930
Thermodynamic stability of high phosphorus concentration in silicon nanostructures
Nanoscale [Royal Society of Chemistry], Volume: 7 Issue: 34 Pages: 14469-14475
Journal of Materials Chemistry C [Royal Society of Chemistry], Volume: 3 Issue: 33 Pages: 8618-8624
High aspect ratio PS-b-PMMA block copolymer masks for lithographic applications
ACS Applied Materials & Interfaces [AMER CHEMICAL SOC], Volume: 6 Issue: 23 Pages: 21389-21396
Solid-state dewetting of ultra-thin Au films on SiO {sub 2} and HfO {sub 2}
Nanotechnology [], Volume: 25
High aspect ratio PS-b-PMMA block copolymer masks for lithographic applications
ACS applied materials & interfaces [American Chemical Society], Volume: 6 Issue: 23 Pages: 21389-21396
Silicon crystallization in nanodot arrays organized by block copolymer lithography
Journal of nanoparticle research [Springer Netherlands], Volume: 16 Issue: 12 Pages: 1-10
Solid-state dewetting of ultra-thin Au films on SiO2 and HfO2
Nanotechnology [IOP Publishing], Volume: 25 Issue: 49 Pages: 495603
Journal of Chromatography A [Elsevier], Volume: 1368 Pages: 204-210
Surface and Interface Analysis [], Volume: 46 Issue: S1 Pages: 393-396
Polimeri statistici funzionalizzati per la neutralizzazione di superfici
XXI Convegno Nazionale dell'Associazione Italiana di Scienze e Tecnologie delle Macromolecole [Edizioni Nuova Cultura], Pages: 89
Evolution of lateral ordering in symmetric block copolymer thin films upon rapid thermal processing
Nanotechnology [IOP Publishing], Volume: 25 Issue: 27 Pages: 275601
ACS applied materials & interfaces [American Chemical Society], Volume: 6 Issue: 10 Pages: 7180-7188
APS March Meeting Abstracts [], Volume: 2014 Pages: P1. 167
APS March Meeting Abstracts [], Volume: 2014 Pages: S19. 001
Flash Grafting of Functional Random Copolymers for Surface Neutralization
APS March Meeting Abstracts [], Volume: 2014 Pages: P1. 168
Nanotechnology [IOP Publishing], Volume: 25 Issue: 4 Pages: 045301
Flash grafting of functional random copolymers for surface neutralization
Journal of Materials Chemistry C [Royal Society of Chemistry], Volume: 2 Issue: 25 Pages: 4909-4917
Thermally induced orientational flipping of cylindrical phase diblock copolymers
Journal of Materials Chemistry C [Royal Society of Chemistry], Volume: 2 Issue: 12 Pages: 2175-2182
Journal of Materials Chemistry C [Royal Society of Chemistry], Volume: 2 Issue: 32 Pages: 6655-6664
Macromolecules [American Chemical Society], Volume: 46 Issue: 20 Pages: 8224-8234
Fabrication of well‐ordered arrays of silicon nanocrystals using a block copolymer mask
physica status solidi (a) [], Volume: 210 Issue: 8 Pages: 1477-1484
Rapid thermal processing of self-assembling block copolymer thin films
Nanotechnology [IOP Publishing], Volume: 24 Issue: 31 Pages: 315601
Applied Physics Letters [American Institute of Physics], Volume: 103 Issue: 2 Pages: 023103
Collective behavior of block copolymer thin films within periodic topographical structures
Nanotechnology [IOP Publishing], Volume: 24 Issue: 24 Pages: 245301
Applied Physics Letters [American Institute of Physics], Volume: 102 Issue: 13 Pages: 131603
physica status solidi (a) [WILEY‐VCH Verlag], Volume: 210 Issue: 4 Pages: 732-736
In-plane organization of silicon nanocrystals embedded in SiO2 thin films
Nanotechnology [IOP Publishing], Volume: 24 Issue: 7 Pages: 075302
ToF‐SIMS study of phosphorus diffusion in low‐dimensional silicon structures
Surface and interface analysis [], Volume: 45 Issue: 1 Pages: 386-389
Al2O3 passivation on c-Si surfaces for low temperature solar cell applications
Energy Procedia [Elsevier], Volume: 38 Pages: 872-880
Applied Physics Letters [American Institute of Physics], Volume: 101 Issue: 21 Pages: 211606
Atomic layer deposited TiO 2 for implantable brain-chip interfacing devices
Thin solid films [Elsevier], Volume: 520 Issue: 14 Pages: 4745-4748
Journal of Applied Physics [American Institute of Physics], Volume: 110 Issue: 5 Pages: 053711
The energy band alignment of Si nanocrystals in SiO2
Applied Physics Letters [American Institute of Physics], Volume: 99 Issue: 8 Pages: 082107
Nanotechnology [IOP Publishing], Volume: 22 Issue: 33 Pages: 335303
Nanotechnology [IOP Publishing], Volume: 22 Issue: 33 Pages: 335303
Nanotechnology [IOP Publishing], Volume: 22 Issue: 18 Pages: 185304
Si nanocrystal synthesis in HfO {sub 2}/SiO/HfO {sub 2} multilayer structures
Nanotechnology (Print) [], Volume: 21
Si nanocrystal synthesis in HfO2/SiO/HfO2 multilayer structures
Nanotechnology [IOP Publishing], Volume: 21 Issue: 5 Pages: 055606
XPS and IPE analysis of HfO 2 band alignment with high-mobility semiconductors
Materials science in semiconductor processing [Pergamon], Volume: 11 Issue: 5-6 Pages: 221-225
Energy band alignment at Ti O 2∕ Si interface with various interlayers
Journal of Applied Physics [American Institute of Physics], Volume: 103 Issue: 4 Pages: 043509
Conduction band offset of Hf O 2 on GaAs
Applied Physics Letters [American Institute of Physics], Volume: 91 Issue: 19 Pages: 192902
Energy band alignment of HfO 2 on Ge
Journal of applied physics [American Institute of Physics], Volume: 100 Issue: 9 Pages: 093718
Atomic layer deposition of Lu silicate films using [(Me3Si) 2N] 3Lu
Journal of The Electrochemical Society [IOP Publishing], Volume: 153 Issue: 11 Pages: F271
Band alignment at the La 2 Hf 2 O 7∕(001) Si interface
Applied physics letters [American Institute of Physics], Volume: 88 Issue: 20 Pages: 202903
Band alignment at the La {sub 2} Hf {sub 2} O {sub 7}/(001) Si interface
Applied Physics Letters [], Volume: 88 Issue: 20
X‐ray photoelectron spectroscopy study of energy‐band alignments of Lu2O3 on Ge
Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films [John Wiley & Sons, Ltd.], Volume: 38 Issue: 4 Pages: 494-497
MARCO FANCIULLI, OMAR COSTA, SILVIA
Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices [Springer Science & Business Media], Pages: 263
Defects at the High-k/Semiconductor Inter-faces Investigated by Spin Dependent Spectroscopies
NATO Science Series [], Volume: 220 Pages: 263
Applied Physics Letters [American Institute of Physics], Volume: 87 Issue: 11 Pages: 112904
Phosphorus Deactivation and Electron Mobility Enhancement in Ultrathin Silicon Nanosheets
2023 Silicon Nanoelectronics Workshop (SNW) [IEEE], Pages: 77-78
Characterization of Si Nanocrystals Embedded in SiO2 Matrix by Atom Probe Tomography
EMN Meeting on Nanocrystals [],
JSAP Annual Meetings Extended Abstracts The 77th JSAP Autumn Meeting 2016 [The Japan Society of Applied Physics], Pages: 1841-1841
Magnetic hysteresis in array of magnetic nanostructures by block copolymers
2015 IEEE International Magnetics Conference (INTERMAG) [IEEE], Pages: 1-1
Atomic Characterization of Si Nanocrystals Embedded in SiO2 Matrix by Atom Probe Tomography
JSAP Annual Meetings Extended Abstracts The 62nd JSAP Spring Meeting 2015 [The Japan Society of Applied Physics], Pages: 1774-1774
EFTEM studies on the localization of silicon nanocrystals embedded in SiO2 for nano-devices
Proceeding of the 15th European Microscopy Conference [],
EFTEM studies on the localization of silicon nanocrystals embedded in SiO2 for nano-devices
Proceeding of the 15th European Microscopy Conference [],
PROCESS FOR MANUFACTURING SELF-ASSEMBLED BLOCK COPOLYMER FILMS
US20160082472 [],
Physical, Chemical, and Electrical Characterization of High-κ Dielectrics on Ge and GaAs
Advanced Gate Stacks for High-Mobility Semiconductors [Springer, Berlin, Heidelberg], Pages: 181-209
Experimental determination of the band offset of rare earth oxides on various semiconductors
Rare Earth Oxide Thin Films [Springer, Berlin, Heidelberg], Pages: 269-283
DEFECTS AT THE HIGH-κ/SEMICONDUCTOR INTERFACES INVESTIGATED BY SPIN DEPENDENT SPECTROSCOPIES
Defects in High-k Gate Dielectric Stacks [Springer, Dordrecht], Pages: 263-276
Experimental Determination of the Band Offset of Rare Earth Oxides on Various Semiconductors
Rare Earth Oxide Thin Films [],