Primary tabs
Scientific Productions
Design and Simulation of a Transmon Qubit Chip for Axion Detection
IEEE Transactions on Applied Superconductivity [IEEE],
Electrochemical Society Meeting Abstracts 244 [The Electrochemical Society, Inc.], Issue: 30 Pages: 1552-1552
Nanomaterials [MDPI], Volume: 14 Issue: 1 Pages: 21
Quantum Sensing with superconducting qubits for Fundamental Physics
arXiv preprint arXiv:2310.05238 [],
ACS Appl. Mater. Interfaces [https://pubs.acs.org/doi/full/10.1021/acsami.3c08830], Volume: 15 Pages: 50237-50245
Materials Science in Semiconductor Processing [Pergamon], Volume: 163 Pages: 107548
Giant spin-charge conversion in ultrathin films of the MnPtSb half-Heusler compound
arXiv preprint arXiv:2307.14516 [],
Plasma-Assisted Atomic Layer Deposition of IrO2 for Neuroelectronics
Nanomaterials [MDPI], Volume: 13 Issue: 6 Pages: 976
Giant spin-charge conversion in ultrathin MnPtSb half-Heusler alloy
Bulletin of the American Physical Society [American Physical Society],
Electron spin resonance on a 2D van der Waals CrBr3 uniaxial ferromagnet
Journal of Applied Physics [AIP Publishing LLC], Volume: 133 Issue: 3 Pages: 034301
Nanoscale [Royal Society of Chemistry],
Revealing 2D Magnetism in a Bulk CrSBr Single Crystal by Electron Spin Resonance
Advanced Functional Materials [], Volume: 32 Issue: 45 Pages: 2207044
Physical Review Applied [American Physical Society], Volume: 18 Issue: 4 Pages: 044009
Cu+ → Mn2+ Energy Transfer in Cu, Mn Coalloyed Cs3ZnCl5 Colloidal Nanocrystals
Chemistry of Materials [American Chemical Society], Volume: 34 Issue: 19 Pages: 8603-8612
ACS Energy Letters [American Chemical Society], Volume: 7 Issue: 4 Pages: 1566-1573
Advanced Materials Interfaces [], Volume: 8 Issue: 23 Pages: 2101244
Nano letters [American Chemical Society], Volume: 21 Issue: 14 Pages: 6211-6219
Superconducting microresonators for electron spin resonance, the good, the bad, and the future
arXiv preprint arXiv:2106.04163 [],
Advanced Functional Materials [Wiley-VCH], Pages: 2109361
Fe/Sb2Te3 Interface Reconstruction through Mild Thermal Annealing
Advanced Materials Interfaces [], Volume: 7 Issue: 19 Pages: 2000905
Probing two-level systems with electron spin inversion recovery of defects at the Si/SiO interface
Physical Review Research [American Physical Society], Volume: 2 Issue: 3 Pages: 033507
Journal of Magnetism and Magnetic Materials [North-Holland], Volume: 509 Pages: 166885
Bright Blue Emitting Cu-doped Cs2ZnCl4 Colloidal Nanocrystals
Chemistry of Materials [American Chemical Society], Volume: 32 Issue: 13 Pages: 5897-5903
Proceedings of the National Academy of Sciences [National Academy of Sciences], Volume: 117 Issue: 9 Pages: 4559-4564
ALD growth of ultra-thin Co layers on the topological insulator Sb 2 Te 3
Nano Research [Tsinghua University Press], Volume: 13 Issue: 2 Pages: 570-575
Publications Repository-Helmholtz-Zentrum Dresden-Rossendorf
Physical Review B Phys Rev B [American Physical Society], Volume: 101 Pages: 174430
Probing two-level systems with electron spin inversion recovery of defects at the interface
Phys. Rev. Research [APS Physics], Volume: 2 Pages: 033507
Journal of Applied Physics [AIP Publishing LLC], Volume: 126 Issue: 12 Pages: 123903
Phonon-induced relaxation and decoherence times of the hybrid qubit in silicon quantum dots
Physical Review B [APS], Volume: 100 Pages: 035310
Towards Oxide Electronics: A Roadmap
Applied surface science [], Volume: 482 Pages: 1-93
Chemical, structural and magnetic properties of the Fe/Sb2Te3 interface
Journal of Magnetism and Magnetic Materials [North-Holland], Volume: 474 Pages: 632-636
In-doped Sb nanowires grown by MOCVD for high speed phase change memories
Micro and Nano Engineering [Elsevier], Volume: 2 Pages: 117-121
In-doped Sb nanowires grown by MOCVD for high speed phase change memories.
Micro and Nano Engineering [Elsevier], Volume: 2 Pages: 117-121
Ambient atmosphere laser-induced local ripening of MoS2 nanoparticles.
Journal of Materials Chemistry C [Royal Society of Chemistry], Volume: 7 Issue: 42 Pages: 13261-13266
Physical Review Applied [American Physical Society], Volume: 10 Issue: 6 Pages: 064053
Chemical, structural and magnetic properties of the Fe/Sb2Te3 interface
Journal of Magnetism and Magnetic Materials [North-Holland],
Coherence time analysis in semiconducting hybrid qubit under realistic experimental conditions
Advanced Quantum Technologies [], Volume: 1 Issue: 3 Pages: 1800040
Trap-Mediated Two-Step Sensitization of Manganese Dopants in Perovskite Nanocrystals
ACS Energy Letters [American Chemical Society], Volume: 4 Issue: 1 Pages: 85-93
Colloidal Synthesis of Double Perovskite Cs2AgInCl6 and Mn-doped Cs2AgInCl6 Nanocrystals
Journal of the American Chemical Society [American Chemical Society], Volume: 140 Issue: 40 Pages: 12989-12995
Semiconducting double-dot exchange-only qubit dynamics in presence of magnetic and charge noises
Quantum Information Processing [Springer US], Volume: 17 Issue: 6 Pages: 130
Publications Repository-Helmholtz-Zentrum Dresden-Rossendorf
Physical Review Letters [], Volume: 120 Pages: 052501
Coherence Time of a Semiconductor Hybrid Qubit in Presence of Environmental Noises
APS March Meeting Abstracts [], Volume: 2018 Pages: H28. 009
Gate fidelity comparison in semiconducting spin qubit implementations affected by control noises
Journal of Physics Communications [IOP], Volume: 2 Pages: 115022
Semiconducting double-dot exchange-only qubit dynamics in the presence of magnetic and charge noises
Quantum Information Processing [Springer US], Volume: 17 Issue: 6 Pages: 130
Colloidal Synthesis of Double Perovskite Cs₂AgInCl₆ and Mn-Doped Cs₂AgInCl₆ Nanocrystals
Journal of the American Chemical Society [American Chemical Society],
Publications Repository-Helmholtz-Zentrum Dresden-Rossendorf
Journal of Cleaner Production [], Volume: 186 Pages: 585-601
Controlled-NOT gate sequences for mixed spin qubit architectures in a noisy environment
Quantum Information Processing [Springer US], Volume: 16 Issue: 11 Pages: 277
Controlled-NOT gate sequences for mixed spin qubit architectures in a noisy environment
Quantum Information Processing [Springer US], Volume: 16 Issue: 11 Pages: 1-21
Atomic-scale study of the amorphous-to-crystalline phase transition mechanism in GeTe thin films.
Scientific reports [Nature Publishing Group], Volume: 7 Issue: 1 Pages: 1-12
Thermal resistance measurement of In3SbTe2 nanowires
physica status solidi (a) [], Volume: 214 Issue: 5 Pages: 1600500
Thermal resistance measurement of In3SbTe2 nanowires
physica status solidi (a) [], Volume: 214 Issue: 5
CNOT sequences for heterogeneous spin qubit architectures in a noisy environment
APS March Meeting Abstracts [], Volume: 2017 Pages: C42. 004
Analog HfO2-RRAM Switches for Neural Networks
ECS Transactions [IOP Publishing], Volume: 75 Issue: 32 Pages: 85
(Invited) Analog HfO2-RRAM Switches for Neural Networks
ECS Transactions [The Electrochemical Society], Volume: 75 Issue: 32 Pages: 85-94
Publications Repository-Helmholtz-Zentrum Dresden-Rossendorf
Journal of Physical Chemistry C [], Volume: 121 Issue: 44 Pages: 24576-24587
Nature communications [Nature Publishing Group], Volume: 7 Issue: 1 Pages: 1-11
Low power phase change memory switching of ultra-thin In3Sb1Te2 nanowires
Applied Physics Letters [AIP Publishing LLC], Volume: 109 Issue: 21 Pages: 213103
Analog memristive synapse in spiking networks implementing unsupervised learning
Frontiers in neuroscience [Frontiers], Volume: 10 Pages: 482
Thin Solid Films [Elsevier], Volume: 616 Pages: 408-414
Engineering the Growth of MoS2 via Atomic Layer Deposition of Molybdenum Oxide Film Precursor
Advanced Electronic Materials [], Volume: 2 Issue: 10 Pages: 1600330
Experimental study of gradual/abrupt dynamics of HfO2-based memristive devices
Applied Physics Letters [AIP Publishing LLC], Volume: 109 Issue: 13 Pages: 133504
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films [American Vacuum Society], Volume: 34 Issue: 5 Pages: 051510
Analog Hfox-Rram Switches for Neural Networks
ECS Meeting Abstracts [IOP Publishing], Issue: 16 Pages: 1473
Analog Hfox-Rram Switches for Neural Networks
ECS Meeting Abstracts [IOP Publishing], Issue: 16 Pages: 1473
(Invited) Analog Hfox-Rram Switches for Neural Networks
Meeting Abstracts [The Electrochemical Society], Issue: 16 Pages: 1473-1473
Silicon Nanowires: Donors, Surfaces and Interface Defects
ECS Transactions [The Electrochemical Society], Volume: 75 Issue: 4 Pages: 179-187
Silicon Nanowires: Donors, Surfaces and Interface Defects
ECS Transactions [IOP Publishing], Volume: 75 Issue: 4 Pages: 179
(Invited) Silicon Nanowires: Donors, Surfaces and Interface Defects
ECS Transactions [The Electrochemical Society], Volume: 75 Issue: 4 Pages: 179-187
Modular Printed Circuit Boards for Broadband Characterization of Nanoelectronic Quantum Devices
IEEE Transactions on Instrumentation and Measurement [IEEE], Volume: 65 Issue: 8 Pages: 1827-1835
P‐164: Organic Light Emitting Transistors (OLETs) using ALD‐grown Al2O3 dielectric
SID Symposium Digest of Technical Papers [], Volume: 47 Issue: 1 Pages: 1737-1739
4 f excitations in Ce Kondo lattices studied by resonant inelastic x-ray scattering
Physical Review B [American Physical Society], Volume: 93 Issue: 16 Pages: 165134
Applied Surface Science [North-Holland], Volume: 368 Pages: 470-476
Atomic Layer Deposition of hexagonal ErFeO 3 thin films on SiO 2/Si
Thin Solid Films [Elsevier], Volume: 604 Pages: 18-22
Giant g factor tuning of long-lived electron spins in Ge
arXiv preprint arXiv:1603.08783 [],
Quantum Information Processing Topical Collection [],
Physics Letters A [North-Holland], Volume: 380 Issue: 11-12 Pages: 1205-1209
Electron Confinement at the Si/MoS2 Heterosheet Interface
Advanced Materials Interfaces [Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim],
MOCVD growth and structural characterization of In–Sb–Te nanowires
physica status solidi (a) [], Volume: 213 Issue: 2 Pages: 335-338
Defects and Dopants in Silicon Nanowires Produced by Metal-Assisted Chemical Etching
ECS Journal of Solid State Science and Technology [The Electrochemical Society], Volume: 5 Issue: 4 Pages: P3138-P3141
Publications Repository-Helmholtz-Zentrum Dresden-Rossendorf
Materials Science and Engineering C [], Volume: 62 Pages: 444-449
PROCEEDINGS-IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS
Ultrasound [], Volume: 21 Pages: 24
Publications Repository-Helmholtz-Zentrum Dresden-Rossendorf
Materials Science and Engineering C [], Volume: 62 Pages: 444-449
Thermal resistance measurement of In3SbTe2 nanowires
PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE [John Wiley & Sons], Volume: 214 Issue: 5
Ground and excited states of iron centers in ZnO: Pulse-EPR and magneto-optical spectroscopy
Physical Review B [American Physical Society], Volume: 92 Issue: 19 Pages: 195202
Synaptic potentiation and depression in Al: HfO 2-based memristor
Microelectronic Engineering [Elsevier], Volume: 147 Pages: 41-44
Defects and Dopants in Silicon and Germanium Nanowires
ECS Transactions [IOP Publishing], Volume: 69 Issue: 5 Pages: 69
(Invited) Defects and Dopants in Silicon and Germanium Nanowires
ECS Transactions [The Electrochemical Society], Volume: 69 Issue: 5 Pages: 69-79
Valley blockade and multielectron spin-valley Kondo effect in silicon
Physical Review B [American Physical Society], Volume: 92 Issue: 3 Pages: 035424
Nucleation and temperature-driven phase transitions of silicene superstructures on Ag (1 1 1)
Journal of Physics: Condensed Matter [IOP Publishing], Volume: 27 Issue: 25 Pages: 255005
Analysis of hyperfine structure in chalcogen-doped silicon and germanium nanowires
Physical Review B [American Physical Society], Volume: 91 Issue: 12 Pages: 125430
Silicene on Silver: fundamental physical properties and integration in Field-Effect Transistors
Bulletin of the American Physical Society [American Physical Society], Volume: 60
Electron confinement at the Si-MoS2 heterosheet junction
Bulletin of the American Physical Society [American Physical Society], Volume: 60
Admittance spectroscopy of interface traps in MoS2 nanosheet capacitors
APS March Meeting Abstracts [], Volume: 2015 Pages: H1. 234
Silicene field-effect transistors operating at room temperature
Nature nanotechnology [Nature Publishing Group], Volume: 10 Issue: 3 Pages: 227-231
Coherent tunneling by adiabatic passage of an exchange-only spin qubit in a double quantum dot chain
Physical Review B [American Physical Society], Volume: 91 Issue: 7 Pages: 075435
Atomic‐Scale Magnetic Properties of Truly 3d‐Diluted ZnO
Advanced Electronic Materials [], Volume: 1 Issue: 1-2 Pages: 1400039
Universal set of quantum gates for double-dot exchange-only spin qubits with intradot coupling
Journal of Physics A: Mathematical and Theoretical [IOP Publishing], Volume: 48 Issue: 6 Pages: 065304
Quantum Information Processing [Springer US], Volume: 14 Issue: 1 Pages: 47-65
Surface & Coatings Technology [Elsevier], Volume: 280 Pages: 37–42
Thin Solid Films [Elsevier], Volume: 563 Pages: 44-49
Thin solid films [Elsevier], Volume: 563 Pages: 44-49
Thin Solid Films [], Volume: 563
Spin-dependent recombination and single charge dynamics in silicon nanostructrures
The European Physical Journal Plus [Springer Berlin Heidelberg], Volume: 129 Issue: 6 Pages: 1-4
2D Materials [IOP Publishing], Volume: 1 Issue: 1 Pages: 011010
Synthesis of multiferroic Er-Fe-O thin films by atomic layer and chemical vapor deposition
Journal of Applied Physics [American Institute of Physics], Volume: 115 Issue: 17 Pages: 17D907
Effective Hamiltonian for the hybrid double quantum dot qubit
Quantum information processing [Springer US], Volume: 13 Issue: 5 Pages: 1155-1173
Two‐Dimensional Si Nanosheets with Local Hexagonal Structure on a MoS2 Surface
Advanced Materials [], Volume: 26 Issue: 13 Pages: 2096-2101
Electron spin resonance of substitutional nitrogen in silicon
Physical Review B [American Physical Society], Volume: 89 Issue: 11 Pages: 115207
ACS applied materials & interfaces [American Chemical Society], Volume: 6 Issue: 5 Pages: 3455-3461
Optical investigation of epitaxial silicene on Ag (111)
APS March Meeting Abstracts [], Volume: 2014 Pages: T51. 005
Universal Set of Quantum Gates for Double-Dot Exchange-Only Spin Qubits Under Realistic Conditions
APS March Meeting Abstracts [], Volume: 2014 Pages: J36. 010
Donor Wave Functions Delocalization in Silicon Nanowires
APS March Meeting Abstracts [], Volume: 2014 Pages: L44. 002
Journal of Physics D: Applied Physics [IOP Publishing], Volume: 47 Issue: 10 Pages: 102002
Theoretical aspects of graphene-like group IV semiconductors
Applied surface science [North-Holland], Volume: 291 Pages: 98-103
Exploring the morphological and electronic properties of silicene superstructures
Applied surface science [North-Holland], Volume: 291 Pages: 109-112
Applied Surface Science [North-Holland], Volume: 291 Pages: 3-5
Applied surface science [North-Holland], Volume: 291 Pages: 3-5
Applied Surface Science [], Volume: 291
Vibrational properties of epitaxial silicene layers on (111) Ag
Applied surface science [North-Holland], Volume: 291 Pages: 113-117
Journal of Applied Physics [], Volume: 115 Issue: 2
Journal of Applied Physics [American Institute of Physics], Volume: 115 Issue: 2 Pages: 023508
Journal of Applied Physics [AMER INST PHYSICS], Volume: 115 Issue: 2
Evidence for graphite-like hexagonal AlN nanosheets epitaxially grown on single crystal Ag (111)
Applied Physics Letters [American Institute of Physics], Volume: 103 Issue: 25 Pages: 251605
Low-temperature atomic layer deposition of MgO thin films on Si
Journal of Physics D: Applied Physics [IOP Publishing], Volume: 46 Issue: 48 Pages: 485304
Donor Wave Functions Delocalization in Silicon Nanowires: The Peculiar [011] Orientation
Nano letters [American Chemical Society], Volume: 13 Issue: 10 Pages: 4963-4968
Hindering the oxidation of silicene with non‐reactive encapsulation
Advanced Functional Materials [WILEY‐VCH Verlag], Volume: 23 Issue: 35 Pages: 4340-4344
Advanced Functional Materials [WILEY‐VCH Verlag], Volume: 23 Issue: 35 Pages: 4339-4339
(Invited) Structural and Chemical Stabilization of the Epitaxial Silicene
ECS Transactions [The Electrochemical Society], Volume: 58 Issue: 7 Pages: 217-227
Structural and chemical stabilization of the epitaxial silicene
ECS Transactions [IOP Publishing], Volume: 58 Issue: 7 Pages: 217
Getting through the nature of silicene: An sp2–sp3 two-dimensional silicon nanosheet
The Journal of Physical Chemistry C [American Chemical Society], Volume: 117 Issue: 32 Pages: 16719-16724
ECS Journal of Solid State Science and Technology [IOP Publishing], Volume: 2 Issue: 9 Pages: P395
Asymptotically cylindrical Calabi–Yau 3–folds from weak Fano 3–folds
Geometry & Topology [Mathematical Sciences Publishers], Volume: 17 Issue: 4 Pages: 1955-2059
Physical review letters [American Physical Society], Volume: 110 Issue: 20 Pages: 206101
ECS Transactions [IOP Publishing], Volume: 50 Issue: 13 Pages: 11
Surface and interface analysis [], Volume: 45 Issue: 1 Pages: 390-393
ToF‐SIMS study of phosphorus diffusion in low‐dimensional silicon structures
Surface and interface analysis [], Volume: 45 Issue: 1 Pages: 386-389
Applied Physics Express [IOP Publishing], Volume: 5 Issue: 12 Pages: 124001
Fe charge state adjustment in ZnO upon ion implantation
Journal of Physics: Condensed Matter [IOP Publishing], Volume: 24 Issue: 48 Pages: 485801
Electronic properties of pristine and Se doped [001] silicon nanowires: an ab initio study
Journal of nanoscience and nanotechnology [American Scientific Publishers], Volume: 12 Issue: 11 Pages: 8704-8709
Local electronic properties of corrugated silicene phases
Advanced Materials [WILEY‐VCH Verlag], Volume: 24 Issue: 37 Pages: 5088-5093
The Journal of Physical Chemistry C [American Chemical Society], Volume: 116 Issue: 35 Pages: 18746-18751
Journal of Applied Physics [American Institute of Physics], Volume: 112 Issue: 1 Pages: 014107
Semiconductor Science and Technology [IOP Publishing], Volume: 27 Issue: 7 Pages: 074013
ECS Meeting Abstracts [IOP Publishing], Issue: 28 Pages: 2457
Few electron limit of n-type metal oxide semiconductor single electron transistors
Nanotechnology [IOP Publishing], Volume: 23 Issue: 21 Pages: 215204
Charge dynamics of a single donor coupled to a few-electron quantum dot in silicon
Applied Physics Letters [AIP Publishing], Volume: 100 Issue: 21 Pages: 213107
Atomic layer deposited TiO 2 for implantable brain-chip interfacing devices
Thin solid films [Elsevier], Volume: 520 Issue: 14 Pages: 4745-4748
Thin solid films [Elsevier], Volume: 520 Issue: 14 Pages: 4820-4822
Thin solid films [Elsevier], Volume: 520 Issue: 14 Pages: 4617-4621
Thin solid films [Elsevier], Volume: 520 Issue: 14 Pages: 4617-4621
Thin Solid Films [], Volume: 520
Thin Solid Films [Elsevier], Volume: 520 Issue: 14 Pages: 4586-4589
Journal of Applied Physics [American Institute of Physics], Volume: 111 Issue: 7 Pages: 07C506
Role of the Oxygen Content in the GeO2 Passivation of Ge Substrates as a Function of the Oxidizer
Journal of The Electrochemical Society [IOP Publishing], Volume: 159 Issue: 6 Pages: H555
Metal organic chemical vapor deposition of phase change Ge1Sb2Te4 nanowires
Nano letters [American Chemical Society], Volume: 12 Issue: 3 Pages: 1509-1515
Inspecting the microstructure of electrically active defects at the Ge/GeOx interface
APS March Meeting Abstracts [], Volume: 2012 Pages: S1. 096
APS March Meeting Abstracts [], Volume: 2012 Pages: J24. 004
Atomic Layer Deposition of Al-Doped ZrO2 Thin Films as Gate Dielectric for In0. 53Ga0. 47As
Journal of The Electrochemical Society [The Electrochemical Society], Volume: 159 Issue: 3 Pages: H220-H224
Thin Solid Films [Elsevier Science], Volume: 520 Issue: 14 Pages: 4507-4507
Mass Production of Silicon MOS-SETs: Can We Live with Nano-Devices’ Variability?
Procedia Computer Science [Elsevier], Volume: 7 Pages: 266-268
Atomic layer deposition of Al-doped ZrO2 thin films as gate dielectric for In0. 53Ga0. 47As
Journal of The Electrochemical Society [IOP Publishing], Volume: 159 Issue: 3 Pages: H220
Switching quantum transport in a three donors silicon fin-field effect transistor
Applied Physics Letters [AIP Publishing], Volume: 99 Issue: 24 Pages: 242102
Applied Physics Letters [American Institute of Physics], Volume: 99 Issue: 23 Pages: 232907
Confinement effects and hyperfine structure in Se doped silicon nanowires
Nano letters [American Chemical Society], Volume: 11 Issue: 11 Pages: 4509-4514
Applied Physics Letters [American Institute of Physics], Volume: 99 Issue: 19 Pages: 193505
Fe/BaTiO3 interface: Band alignment and chemical properties
Applied Physics Letters [American Institute of Physics], Volume: 99 Issue: 18 Pages: 182905
Journal of Applied Physics [American Institute of Physics], Volume: 110 Issue: 8 Pages: 084504
ECS Transactions [The Electrochemical Society], Volume: 41 Issue: 3 Pages: 203-221
ECS Transactions [IOP Publishing], Volume: 41 Issue: 3 Pages: 203
Applied physics express [IOP Publishing], Volume: 4 Issue: 9 Pages: 094103
Active Trap Determination at the Interface of Ge and InxGa1-xAs Substrates with Dielectric Layers
ECS Meeting Abstracts [IOP Publishing], Issue: 27 Pages: 1899
Electrically detected magnetic resonance of donors and interfacial defects in silicon nanowires
Nanoscience and Nanotechnology Letters [American Scientific Publishers], Volume: 3 Issue: 4 Pages: 568-574
Nanotechnology [IOP Publishing], Volume: 22 Issue: 33 Pages: 335303
Nanotechnology [IOP Publishing], Volume: 22 Issue: 33 Pages: 335303
Physical Review B [American Physical Society], Volume: 84 Issue: 2 Pages: 024415
Microelectronic engineering [Elsevier], Volume: 88 Issue: 7 Pages: 1482-1487
Detection of the tetragonal phase in atomic layer deposited La-doped ZrO2 thin films on germanium
Journal of The Electrochemical Society [IOP Publishing], Volume: 158 Issue: 8 Pages: G194
Physical Review B [American Physical Society], Volume: 83 Issue: 23 Pages: 235204
Al 2 O 3 stacks on In 0.53 Ga 0.47 As substrates: In situ investigation of the interface
Microelectronic Engineering [Elsevier], Volume: 88 Issue: 4 Pages: 435-439
Microelectronic Engineering [Elsevier], Volume: 88 Issue: 4 Pages: 431-434
Microelectronic Engineering [Elsevier], Volume: 88 Issue: 4 Pages: 403-406
Atomic Layer Deposition of Al-Doped ZrO2 Thin Films for Advanced Gate Stack on III-V Substrates
ECS Transactions [IOP Publishing], Volume: 35 Issue: 3 Pages: 431
ECS Transactions [IOP Publishing], Volume: 35 Issue: 3 Pages: 481
Applied physics express [IOP Publishing], Volume: 4 Issue: 5 Pages: 051101
EPR spectroscopy of weak exchange interactions between Co2+ ions in ZnO
physica status solidi (RRL)–Rapid Research Letters [WILEY‐VCH Verlag], Volume: 5 Issue: 4 Pages: 138-140
Al2O3 stacks on In0. 53Ga0. 47As substrates: In situ investigation of the interface
Microelectronic engineering [Elsevier], Volume: 88 Issue: 4 Pages: 435-439
Solid-State Electronics [Pergamon], Volume: 58 Issue: 1 Pages: 42-47
Microelectronic engineering [Elsevier], Volume: 88 Issue: 4 Pages: 403-406
Structural and electrical properties of Er-doped HfO 2 and of its interface with Ge (001)
Microelectronic engineering [Elsevier], Volume: 88 Issue: 4 Pages: 415-418
Microelectronic Engineering [Elsevier BV], Volume: 88 Issue: 4 Pages: 435-439
Microelectronic engineering [Elsevier], Volume: 88 Issue: 4 Pages: 431-434
Microelectronic engineering [Elsevier], Volume: 88 Issue: 4 Pages: 419-422
Microelectronic engineering [Elsevier], Volume: 88 Issue: 4 Pages: 388-390
Thin Solid Films [Elsevier], Volume: 519 Issue: 11 Pages: 3798-3803
Chemical Physics [North-Holland], Volume: 380 Issue: 1-3 Pages: 67-76
Scaling analysis of submicrometer nickel-oxide-based resistive switching memory devices
Journal of Applied Physics [American Institute of Physics], Volume: 109 Issue: 3 Pages: 034506
Adiabatic charge control in a single donor atom transistor
Applied physics letters [AIP Publishing], Volume: 98 Issue: 5 Pages: 053109
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena [American Vacuum Society], Volume: 29 Issue: 1 Pages: 01AE04
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena [American Vacuum Society], Volume: 29 Issue: 1 Pages: 01AE03
Au-catalyzed self assembly of GeTe nanowires by MOCVD
Journal of crystal growth [North-Holland], Volume: 315 Issue: 1 Pages: 152-156
Applied Physics Express [], Volume: 4 Pages: 094103
O 3-based atomic layer deposition of hexagonal La 2 O 3 films on Si (100) and Ge (100) substrates
Journal of Applied Physics [American Institute of Physics], Volume: 108 Issue: 8 Pages: 084108
Paramagnetism in Mn/Fe implanted ZnO
Applied Physics Letters [American Institute of Physics], Volume: 97 Issue: 14 Pages: 142501
Evaluation of HfLaOx as Blocking Layer for Innovative Nonvolatile Memory Applications
ECS Transactions [IOP Publishing], Volume: 33 Issue: 3 Pages: 417
LaHfOx Films Analyses for NVM Applications
ECS Meeting Abstracts [IOP Publishing], Issue: 22 Pages: 1523
Moessbauer study of {sup 57} Fe in GaAs and GaP following {sup 57} Mn {sup+} implantation
Hyperfine Interactions [], Volume: 198
Photo‐EPR and magneto‐optical spectroscopy of iron centres in ZnO
physica status solidi (b) [WILEY‐VCH Verlag], Volume: 247 Issue: 6 Pages: 1517-1520
Mössbauer study of 57 Fe in GaAs and GaP following 57 Mn+ implantation
Hyperfine Interactions [Springer Netherlands], Volume: 198 Issue: 1 Pages: 15-22
Influence of the oxidizing species on the Ge dangling bonds at the (100) Ge/GeO 2 interface
Applied physics letters [American Institute of Physics], Volume: 96 Issue: 22 Pages: 222110
Ultraviolet optical near-fields of microspheres imprinted in phase change films
Applied physics letters [American Institute of Physics], Volume: 96 Issue: 19 Pages: 193108
Stark effect of confined shallow levels in phosphorus-doped silicon nanocrystals
Physical Review B [American Physical Society], Volume: 81 Issue: 19 Pages: 195302
Applied Physics Letters [American Institute of Physics], Volume: 96 Issue: 18 Pages: 182901
Observation of spin-lattice relaxations of dilute Fe 3+ in MgO by Mössbauer spectroscopy
Hyperfine Interactions [Springer Netherlands], Volume: 197 Issue: 1 Pages: 89-94
Magnetism in iron implanted oxides: a status report
Hyperfine Interactions [Springer Netherlands], Volume: 197 Issue: 1 Pages: 43-52
Microwave Effects in Silicon Low Dimensional Nanostructures
Journal of nanoscience and nanotechnology [American Scientific Publishers], Volume: 10 Issue: 4 Pages: 2650-2655
Measuring the temperature of a mesoscopic electron system by means of single electron statistics
Applied physics letters [AIP Publishing], Volume: 96 Issue: 11 Pages: 113109
Rare earth-based high-k materials for non-volatile memory applications
Microelectronic engineering [Elsevier], Volume: 87 Issue: 3 Pages: 290-293
Si nanocrystal synthesis in HfO {sub 2}/SiO/HfO {sub 2} multilayer structures
Nanotechnology (Print) [], Volume: 21
arXiv preprint arXiv:1002.0037 [],
Journal of Physics D: Applied Physics [IOP Publishing], Volume: 43 Issue: 6 Pages: 065002
Publications Repository-Helmholtz-Zentrum Dresden-Rossendorf
Applied Physics Letters [], Volume: 97 Pages: 163117
Observation of spin-lattice relaxations of dilute Fe3+ in MgO by Mˆssbauer spectroscopy
Hyperfine Interactions [Springer], Volume: 197 Issue: 1-3 Pages: 89-94
Interface analysis of Ge ultra thin layers intercalated between GaAs substrates and oxide stacks
Thin solid films [Elsevier], Volume: 518 Issue: 6 Pages: S123-S127
High permittivity materials for oxide gate stack in Ge-based metal oxide semiconductor capacitors
Thin solid films [Elsevier], Volume: 518 Issue: 6 Pages: S96-S103
Si nanocrystal synthesis in HfO2/SiO/HfO2 multilayer structures
Nanotechnology [IOP Publishing], Volume: 21 Issue: 5 Pages: 055606
Ab initio study of the magnetic interaction of Co and Ni doped ZnO with intrinsic vacancies
Physica B: Condensed Matter [North-Holland], Volume: 404 Issue: 23-24 Pages: 4791-4793
Temperature and dose dependence of defect complex formation with ion implanted Mn/Fe in ZnO
Physica B: Condensed Matter [North-Holland], Volume: 404 Issue: 23-24 Pages: 4820-4822
Compact silicon double and triple dots realized with only two gates
Applied physics letters [AIP Publishing], Volume: 95 Issue: 24 Pages: 242107
Phosphorus doping of ultra-small silicon nanocrystals
Nanotechnology [IOP Publishing], Volume: 21 Issue: 2 Pages: 025602
MRS Online Proceedings Library [Springer International Publishing], Volume: 1194 Issue: 1 Pages: 80-88
Microwave-assisted transport in a single-donor silicon quantum dot
Physical Review B [American Physical Society], Volume: 80 Issue: 16 Pages: 165331
Transition Metal Binary Oxides for ReRAM Applications
ECS Transactions [IOP Publishing], Volume: 25 Issue: 6 Pages: 411
Applied Physics Letters [American Institute of Physics], Volume: 95 Issue: 12 Pages: 122902
Dehydrogenation at the Fe/Lu 2 O 3 interface upon rapid thermal annealing
Journal of Magnetism and Magnetic Materials [North-Holland], Volume: 321 Issue: 15 Pages: 2350-2353
Dehydrogenation at the Fe/Lu2O3 interface upon rapid thermal annealing
Journal of magnetism and magnetic materials [North-Holland], Volume: 321 Issue: 15 Pages: 2350-2353
Applied Physics Letters [American Institute of Physics], Volume: 95 Issue: 2 Pages: 023507
Effect of high-temperature annealing on lanthanum aluminate thin films grown by ALD on Si (100)
Microelectronic engineering [Elsevier], Volume: 86 Issue: 7-9 Pages: 1696-1699
Multi layer structure for encapsulation of organic transistors
Organic Electronics [North-Holland], Volume: 10 Issue: 4 Pages: 692-695
Microelectronic engineering [Elsevier], Volume: 86 Issue: 7-9 Pages: 1777-1779
Thermal and electrical characterization of materials for phase-change memory cells
Journal of Chemical & Engineering Data [American Chemical Society], Volume: 54 Issue: 6 Pages: 1698-1701
Mössbauer study of Fe in GaAs following 57Mn+ implantation
Hyperfine Interactions [Springer Netherlands], Volume: 191 Issue: 1 Pages: 115-120
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films [American Vacuum Society], Volume: 27 Issue: 3 Pages: 443-448
Bipolar resistive electrical switching of CuTCNQ memories incorporating a dedicated switching layer
IEEE electron device letters [IEEE], Volume: 30 Issue: 6 Pages: 620-622
Confinement effect in P doped spherical Si nanocrystals
Solid state sciences [Elsevier Masson], Volume: 11 Issue: 5 Pages: 961-964
Growth and study of ultrathin insulating SiO2 and MgO layers on the ferromagnetic electrode surface
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques [SP MAIK Nauka/Interperiodica], Volume: 3 Issue: 2 Pages: 173-178
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films [American Vacuum Society], Volume: 27 Issue: 2 Pages: L1-L7
Atomic layer deposition of La x Zr 1− x O 2− δ (x= 0.25) high-k dielectrics for advanced gate stacks
Applied Physics Letters [American Institute of Physics], Volume: 94 Issue: 5 Pages: 053504
Journal of Applied Physics [American Institute of Physics], Volume: 105 Issue: 3 Pages: 033520
Resistive electrical switching of CuTCNQ based memory with a dedicated switching layer
Proceedings of the MRS Spring Meeting Symposium H: Materials and Physics for Nonvolatile Memories [],
57 Fe Mössbauer investigations in p-type Silicon Germanium single crystals
Hyperfine Interactions [Springer Netherlands], Volume: 188 Issue: 1 Pages: 11-17
Journal of The Electrochemical Society [The Electrochemical Society], Volume: 156 Issue: 1 Pages: H1-H6
Hyperfine Interactions [Springer Netherlands], Volume: 188 Issue: 1 Pages: 85-89
Hyperfine Interactions [Springer Netherlands], Volume: 188 Issue: 1 Pages: 85-89
Electron Spin Resonance and Related Phenomena in Low-Dimensional Structures [Springer Berlin/Heidelberg], Pages: 221-239
Journal of the Electrochemical Society [], Volume: 156 Issue: 1 Pages: H1
Microelectronic Engineering [], Volume: 86 Issue: 10 Pages: 2138
Microelectronic Engineering [Elsevier], Volume: 85 Issue: 12 Pages: 2411-2413
Evidence of dangling bond electrical activity at the Ge/oxide interface
Applied Physics Letters [American Institute of Physics], Volume: 93 Issue: 24 Pages: 242105
Microelectronic Engineering [Elsevier], Volume: 85 Issue: 12 Pages: 2414-2419
Microelectronic Engineering [Elsevier], Volume: 85 Issue: 12 Pages: 2425-2429
Microelectronic Engineering [Elsevier], Volume: 85 Issue: 12 Pages: 2411-2413
Journal of Crystal Growth [North-Holland], Volume: 310 Issue: 24 Pages: 5464-5468
Growth study of GexSbyTez deposited by MOCVD under nitrogen for non-volatile memory applications
Journal of Crystal Growth [North-Holland], Volume: 310 Issue: 23 Pages: 5053-5057
Materials Science in Semiconductor Processing [Pergamon], Volume: 11 Issue: 5 Pages: 236-240
Journal of The Electrochemical Society [IOP Publishing], Volume: 156 Issue: 1 Pages: H1
ALD-Grown Rare Earth Oxides for Advanced Gate Stacks
ECS Transactions [IOP Publishing], Volume: 13 Issue: 1 Pages: 77
Applied physics letters [American Institute of Physics], Volume: 93 Issue: 15 Pages: 152906
Materials science in semiconductor processing [Pergamon], Volume: 11 Issue: 5-6 Pages: 236-240
XPS and IPE analysis of HfO 2 band alignment with high-mobility semiconductors
Materials science in semiconductor processing [Pergamon], Volume: 11 Issue: 5-6 Pages: 221-225
Epitaxial anatase HfO 2 on high-mobility substrate for ultra-scaled CMOS devices
Materials science in semiconductor processing [Pergamon], Volume: 11 Issue: 5-6 Pages: 241-244
Structure and interface bonding of Ge O 2∕ Ge∕ In 0.15 Ga 0.85 As heterostructures
Applied Physics Letters [American Institute of Physics], Volume: 93 Issue: 13 Pages: 133504
Size dependence of the Mössbauer recoilless fraction in β-Sn nanocrystals
Journal of Physics: Condensed Matter [IOP Publishing], Volume: 20 Issue: 38 Pages: 385201
Journal of The Electrochemical Society [IOP Publishing], Volume: 155 Issue: 10 Pages: H807
Synthesis and characterization of Fe3Si/SiO2 structures for spintronics
physica status solidi (a) [WILEY‐VCH Verlag], Volume: 205 Issue: 8 Pages: 1753-1757
57Fe Mössbauer spectroscopy and magnetic measurement studies of oxygen deficient LaFeAsO
Journal of Physics: Condensed Matter [IOP Publishing], Volume: 20 Issue: 29 Pages: 292201
Journal of Applied Physics [American Institute of Physics], Volume: 103 Issue: 12 Pages: 123707
Spectroscopic ellipsometry study of thin NiO films grown on Si (100) by atomic layer deposition
Applied Physics Letters [American Institute of Physics], Volume: 92 Issue: 22 Pages: 222907
Journal of Applied Physics [American Institute of Physics], Volume: 103 Issue: 10 Pages: 104502
ALD Grown Rare Earth Oxides for Advanced Gate Stack
ECS Meeting Abstracts [IOP Publishing], Issue: 16 Pages: 626
Manipulation of localized charge states in n-MOSFETs with microwave irradiation
Physics Letters A [North-Holland], Volume: 372 Issue: 17 Pages: 3102-3104
Epitaxial growth of cubic Gd2O3 thin films on Ge substrates
Journal of Physics: Conference Series [IOP Publishing], Volume: 100 Issue: 4 Pages: 042048
Energy band alignment at Ti O 2∕ Si interface with various interlayers
Journal of Applied Physics [American Institute of Physics], Volume: 103 Issue: 4 Pages: 043509
Effect of oxygen on the electronic configuration of Gd 2 O 3∕ Ge heterojunctions
Applied Physics Letters [American Institute of Physics], Volume: 92 Issue: 4 Pages: 042106
The magnetic interaction of Fe doped ZnO with intrinsic defects: a first principles study
Physica B: Condensed Matter [North-Holland], Volume: 401 Pages: 451-453
The structure of charge-compensated Fe 3+ ions in ZnO
Physica B: Condensed Matter [North-Holland], Volume: 401 Pages: 382-385
arXiv preprint arXiv:0712.1638 [],
Atomic layer deposition of magnetic thin films
ACTA PHYSICA POLONICA SERIES A [POLISH ACADEMY OF SCIENCES WARSAW], Volume: 112 Issue: 6 Pages: 1271
Defect-related local magnetism at dilute Fe atoms in ion-implanted ZnO
Journal of Applied Physics [American Institute of Physics], Volume: 102 Issue: 11 Pages: 113915
Conduction band offset of Hf O 2 on GaAs
Applied Physics Letters [American Institute of Physics], Volume: 91 Issue: 19 Pages: 192902
Microwave irradiation effects on random telegraph signal in a MOSFET
Physics Letters A [North-Holland], Volume: 370 Issue: 5-6 Pages: 491-493
Applied Physics Letters [American Institute of Physics], Volume: 91 Issue: 17 Pages: 172905
Epitaxial phase of hafnium dioxide for ultrascaled electronics
Physical Review B [American Physical Society], Volume: 76 Issue: 15 Pages: 155405
Microelectronic engineering [Elsevier], Volume: 84 Issue: 9-10 Pages: 1986-1989
Vibrational and electrical properties of hexagonal La 2 O 3 films
APPLIED PHYSICS LETTERS [American Institute of Physics], Volume: 91 Issue: 102901
Zeitschrift für anorganische und allgemeine Chemie [WILEY‐VCH Verlag], Volume: 633 Issue: 11‐12 Pages: 2097-2103
Microelectronic engineering [Elsevier], Volume: 84 Issue: 9-10 Pages: 1886-1889
Microelectronic engineering [Elsevier], Volume: 84 Issue: 9-10 Pages: 2263-2266
Journal of Applied Physics [American Institute of Physics], Volume: 102 Issue: 3 Pages: 034513
Applied physics letters [American Institute of Physics], Volume: 90 Issue: 26 Pages: 263513
Review of scientific instruments [American Institute of Physics], Volume: 78 Issue: 6 Pages: 063902
Interface engineering for Ge metal-oxide–semiconductor devices
Thin Solid Films [Elsevier], Volume: 515 Issue: 16 Pages: 6337-6343
Ab initio study of magnetic interaction of Fe doped ZnO with intrinsic vacancies
Applied physics letters [American Institute of Physics], Volume: 90 Issue: 21 Pages: 212510
An accurate low-frequency model for the 3 ω method
Journal of Applied Physics [American Institute of Physics], Volume: 101 Issue: 10 Pages: 104510
Applied physics letters [American Institute of Physics], Volume: 90 Issue: 19 Pages: 193511
Fabrication of Ge O 2 layers using a divalent Ge precursor
Applied physics letters [American Institute of Physics], Volume: 90 Issue: 16 Pages: 162115
Microelectronics Reliability [Pergamon], Volume: 47 Issue: 4-5 Pages: 657-659
Journal of applied physics [AIP], Volume: 101 Issue: 7 Pages: 074104
Innovative dielectrics for semiconductor technology
Radiation Physics and Chemistry [Pergamon], Volume: 76 Issue: 2 Pages: 189-194
Ch. Dieker, EK Evangelou, S. Galata, M. Houssa, and MM Heyns
Thin Solid Films [], Volume: 515 Pages: 6337
Evidence for a dose dependence for thermal redistribution of implanted silicon in SiO 2
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms [North-Holland], Volume: 254 Issue: 1 Pages: 139-142
HfO 2 as gate dielectric on Ge: Interfaces and deposition techniques
Materials Science and Engineering: B [Elsevier], Volume: 135 Issue: 3 Pages: 256-260
Materials science in semiconductor processing [Pergamon], Volume: 9 Issue: 6 Pages: 1014-1019
Energy band alignment of HfO 2 on Ge
Journal of applied physics [American Institute of Physics], Volume: 100 Issue: 9 Pages: 093718
Nondestructive diagnostics of high-κ dielectrics for advanced electronic devices
Applied physics letters [American Institute of Physics], Volume: 89 Issue: 18 Pages: 183521
Phosphorous–oxygen hole centers in phosphosilicate glass films
Physical Review B [American Physical Society], Volume: 74 Issue: 13 Pages: 134102
Atomic layer deposition of Lu silicate films using [(Me3Si) 2N] 3Lu
Journal of The Electrochemical Society [IOP Publishing], Volume: 153 Issue: 11 Pages: F271
Characterization of transient currents in HfO 2 capacitors in the short timescale
Microelectronic engineering [Elsevier], Volume: 83 Issue: 10 Pages: 1927-1930
Germanium diffusion during Hf O 2 growth on Ge by molecular beam epitaxy
Applied physics letters [American Institute of Physics], Volume: 89 Issue: 12 Pages: 122906
Temperature dependence of transient and steady-state gate currents in Hf O 2 capacitors
Applied physics letters [American Institute of Physics], Volume: 89 Issue: 10 Pages: 103504
Applied physics letters [American Institute of Physics], Volume: 89 Issue: 8 Pages: 083504
Ozone-based atomic layer deposition of alumina from TMA: Growth, morphology, and reaction mechanism
Chemistry of materials [American Chemical Society], Volume: 18 Issue: 16 Pages: 3764-3773
Diffusion reaction of oxygen in HfO2/SiO2/Si stacks
The Journal of Physical Chemistry B [American Chemical Society], Volume: 110 Issue: 30 Pages: 14905-14910
Raman stress maps from finite-element models of silicon structures
Journal of applied physics [American Institute of Physics], Volume: 100 Issue: 3 Pages: 033516
Formation and stability of germanium oxide induced by atomic oxygen exposure
Materials science in semiconductor processing [Pergamon], Volume: 9 Issue: 4-5 Pages: 673-678
Comparative study of negative cluster emission in sputtering of Si, Ge and their oxides
Applied surface science [North-Holland], Volume: 252 Issue: 19 Pages: 7236-7238
Effect of the triplet state on the random telegraph signal in Si n-MOSFETs
Physical Review B [American Physical Society], Volume: 74 Issue: 3 Pages: 033309
Computation of the Stark effect in P impurity states in silicon
Physical Review B [American Physical Society], Volume: 74 Issue: 3 Pages: 035202
High-k materials in flash memories
ECS Transactions [IOP Publishing], Volume: 1 Issue: 5 Pages: 91
Materials Science and Engineering: C [Elsevier], Volume: 26 Issue: 5-7 Pages: 835-839
Russian Microelectronics [Nauka/Interperiodica], Volume: 35 Issue: 4 Pages: 210-215
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms [North-Holland], Volume: 246 Issue: 1 Pages: 90-95
Band alignment at the La 2 Hf 2 O 7∕(001) Si interface
Applied physics letters [American Institute of Physics], Volume: 88 Issue: 20 Pages: 202903
Band alignment at the La {sub 2} Hf {sub 2} O {sub 7}/(001) Si interface
Applied Physics Letters [], Volume: 88 Issue: 20
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms [North-Holland], Volume: 246 Issue: 1 Pages: 90-95
X‐ray photoelectron spectroscopy study of energy‐band alignments of Lu2O3 on Ge
Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films [John Wiley & Sons, Ltd.], Volume: 38 Issue: 4 Pages: 494-497
Identification of substitutional and interstitial Fe in 6H-SiC
Hyperfine interactions [Kluwer Academic Publishers], Volume: 169 Issue: 1 Pages: 1319-1323
Identification of substitutional and interstitial Fe in 6H-SiC
Hyperfine interactions [Kluwer Academic Publishers], Volume: 169 Issue: 1-3 Pages: 1319-1323
Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices [Springer Science & Business Media], Pages: 147
Defects at the High-k/Semiconductor Inter-faces Investigated by Spin Dependent Spectroscopies
NATO Science Series [], Volume: 220 Pages: 263
Defect and Diffusion Forum [], Volume: 258 Pages: 531
Negative cluster emission in sputtering of Si 1− x Ge x alloys: a full spectrum approach
Surface science [North-Holland], Volume: 599 Issue: 1-3 Pages: 141-149
Interstitial injection during oxidation of very low energy nitrogen-implanted silicon
Materials Science and Engineering: B [Elsevier], Volume: 124 Pages: 314-318
Electron spin-echo relaxation and envelope modulation of shallow phosphorus donors in silicon
Physical Review B [American Physical Society], Volume: 72 Issue: 23 Pages: 235201
Random Telegraph Signal In Si n‐MOSFETs: A Way Towards Single Spin Resonance Detection
AIP Conference Proceedings [American Institute of Physics], Volume: 800 Issue: 1 Pages: 125-130
Electron spin echo relaxation and envelope modulation of phosphorus shallow donors in silicon
arXiv preprint cond-mat/0510497 [],
Raman spectroscopy of strain in subwavelength microelectronic devices
Applied Physics Letters [American Institute of Physics], Volume: 87 Issue: 11 Pages: 111913
Applied Physics Letters [American Institute of Physics], Volume: 87 Issue: 11 Pages: 112904
Microwave Induced Effects on the Random Telegraph Signal in a MOSFET
AIP Conference Proceedings [American Institute of Physics], Volume: 780 Issue: 1 Pages: 171-174
AIP Conference Proceedings [American Institute of Physics], Volume: 780 Issue: 1 Pages: 221-224
dc modulation in field-effect transistors operating under microwave irradiation for quantum readout
Journal of applied physics [American Institute of Physics], Volume: 98 Issue: 4 Pages: 044505
CMOS fully compatible microwave detector based on MOSFET operating in resistive regime
IEEE microwave and wireless components letters [IEEE], Volume: 15 Issue: 7 Pages: 445-447
Oxidation-enhanced diffusion of boron in very low-energy N 2+-implanted silicon
Journal of applied physics [American Institute of Physics], Volume: 97 Issue: 11 Pages: 113534
Fabrication of nanocrystal memories by ultra low energy ion implantation
physica status solidi (c) [WILEY‐VCH Verlag], Volume: 2 Issue: 6 Pages: 1907-1911
Journal of applied physics [American Institute of Physics], Volume: 97 Issue: 7 Pages: 074315
Shallow donor electron spins as qubits in silicon: detection and manipulation
APS March Meeting Abstracts [], Pages: X10. 005
X-ray absorption study of the growth of Y 2 O 3 on Si (001)
Physical Review B [American Physical Society], Volume: 71 Issue: 7 Pages: 075318
X-ray absorption study of the growth of Y {sub 2} O {sub 3} on Si (001)
Physical Review. B, Condensed Matter and Materials Physics [], Volume: 71 Issue: 7
Dielectric Properties of High-κ Oxides: Theory and Experiment for L u 2 O 3
Physical review letters [American Physical Society], Volume: 94 Issue: 2 Pages: 027602
IEEE transactions on nanotechnology [IEEE], Volume: 4 Issue: 1 Pages: 100-105
Physical Review-Section B-Condensed Matter [Woodbury, NY: published by the American Physical Society through the American Institute of Physics, c1998-], Volume: 71 Issue: 7 Pages: 75318-75318
Dielectric properties of high-kappa oxides: Theory and experiment for Lu2O3
Physical Review Letters [APS], Volume: 94 Issue: 2 Pages: 027602
Phosphorus Deactivation and Electron Mobility Enhancement in Ultrathin Silicon Nanosheets
2023 Silicon Nanoelectronics Workshop (SNW) [IEEE], Pages: 77-78
A 0.46 nV/√ Hz JFET Low-Noise Amplifier for Characterization of Nanoelectrode Coating Materials
2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS) [IEEE], Pages: 1-4
Vibrational modes at the Si/SiO2 interface detected by pulse electron spin resonance
APS Meeting Abstracts [],
Non-Ideal X-Gate and Z-Gate in Semiconducting Spin Qubit Implementations
Multidisciplinary Digital Publishing Institute Proceedings [], Volume: 12 Issue: 1 Pages: 53
High-k dielectrics for CMOS and emerging logic devices
TO-BE COST Action" Towards Oxide-Based Electronics" Sping Meeting 2018 [],
Progress in Applied Surface, Interface and Thin Film Science 2017. SURFINT-SREN V [],
Long-lived conduction electron spins in Ge quantum wells
International Conference on Silicon Epitaxy and Heterostructures-ICSI-10 [],
(Invited) Defects in Silicon and Germanium Nanowires
PRiME 2016/230th ECS Meeting (October 2-7, 2016) [Ecs],
PRiME 2016/230th ECS Meeting (October 2-7, 2016) [Ecs],
HfO2-based memristors for neuromorphic applications
2016 IEEE International Symposium on Circuits and Systems (ISCAS) [IEEE], Pages: 393-396
Electron spin resonance and relaxation of defects and donors in Silicon Nanowires
APS March Meeting Abstracts [],
Electron spin relaxation and coherence in silicon
European Materials Research Society Fall Meeting [],
X EFEPR Conference Torino 2016 [],
Gradual set dynamics in HfO 2-based memristor driven by sub-threshold voltage pulses
2015 International Conference on Memristive Systems (MEMRISYS) [IEEE], Pages: 1-2
228th ECS Meeting (October 11-15, 2015) [Ecs],
MOCVD growth and thermal analysis of Sb2Te3thin films and nanowires
2015 1st Workshop on Nanotechnology in Instrumentation and Measurement (NANOFIM) [IEEE], Pages: 150-154
MOCVD growth and thermal analysis of Sb2Te3thin films and nanowires
2015 1st Workshop on Nanotechnology in Instrumentation and Measurement (NANOFIM) [IEEE], Pages: 150-154
Electron Spin Resonance of conduction electrons in Ge/SiGe quantum wells
Spin Physics, Spin Chemistry, and Spin Technology [],
Negative-U trapping centers evidenced by admittance spectroscopy at the Ge/GeO2 interface
E-MRS spring meeting [],
Raman spectrum of epitaxial silicene
2013 MRS Spring Meeting, Date: 2013/04/01-2013/04/05, Location: San Francisco [Materials Research Society],
Magnetic resonance characterization of silicon nanowires
APS Meeting Abstracts [], Volume: 1 Pages: 24003
Spin blockade in a triple silicon quantum dot in CMOS technology
APS Meeting Abstracts [], Volume: 1 Pages: 14010
Sub-10 µA reset in NiO-based resistive switching memory (RRAM) cells
2010 IEEE International Memory Workshop [IEEE], Pages: 1-4
Lattice Location and Diffusion of Interstitial Fe in MgO
3rd HFI/NQI 2010 [],
3rd HFI/NQI 2010 [],
Sub-10 microA reset in NiO-based resistive switching memory (RRAM) cells
2010 IEEE International Memory Workshop [], Pages: 66-69
Reliability of NiO-based resistive switching memory (ReRAM) elements with pillar W bottom electrode
2009 IEEE International Memory Workshop [IEEE], Pages: 1-3
Sample variability and time stability in scaled silicon nanowires
2009 10th International Conference on Ultimate Integration of Silicon [IEEE], Pages: 249-252
Tuning the polarity of Si-nanowire transistors without the use of doping
2008 8th IEEE Conference on Nanotechnology [IEEE], Pages: 580-581
2007 IEEE International Electron Devices Meeting [IEEE], Pages: 775-778
Transient currents in HfO2 and their impact on circuit and memory applications
2006 IEEE International Reliability Physics Symposium Proceedings [IEEE], Pages: 651-652
Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy
14th International Winterschool on New Developments in Solid State Physics [],
Defect and Diffusion Forum [Trans Tech Publications Ltd], Volume: 258 Pages: 531-541
Nanocrystals in high-k dielectric stacks for non-volatile memory applications
Advances in Science and Technology [Trans Tech Publications Ltd], Volume: 51 Pages: 156-166
Microwave power detector based on a single MOSFET in standard technology
2005 European Microwave Conference [IEEE], Volume: 2 Pages: 4 pp.-1210
METAMATERIALI CON PASSO RETICOLARE CONFRONTABILE CON LA LUNGHEZZA
II° SIMPOSIO SULLE TECNOLOGIE AVANZATE [], Pages: 105-110
Ultrafast dynamics in epitaxial silicene on Ag (111)
Ultrafast Phenomena XIX [Springer, Cham], Pages: 329-332
Electron spin resonance and related phenomena in low-dimensional structures
[Springer Science & Business Media], Volume: 115
Electron Spin Resonance and Related Phenomena in Low-Dimensional Structures [Springer, Berlin, Heidelberg], Pages: 221-239
Mössbauer spectroscopy study of interfaces for spintronics
ISIAME 2008 [Springer, Berlin, Heidelberg], Pages: 371-376
Photon-Assisted Tunneling in Quantum Dots
Electron Spin Resonance and Related Phenomena in Low-Dimensional Structures [Springer, Berlin, Heidelberg], Pages: 241-258
57Fe Mössbauer investigations in p-type Silicon Germanium single crystals
ICAME 2007 [Springer Berlin Heidelberg], Pages: 1245-1251
Electrical characterization of rare earth oxides grown by atomic layer deposition
Rare Earth Oxide Thin Films [Springer, Berlin, Heidelberg], Pages: 203-223
Experimental determination of the band offset of rare earth oxides on various semiconductors
Rare Earth Oxide Thin Films [Springer, Berlin, Heidelberg], Pages: 269-283
Rare earth oxide thin films [Springer, Berlin, Heidelberg], Pages: 153-177
Scientific and technological issues related to rare earth oxides: An introduction
Rare Earth oxide thin films [Springer, Berlin, Heidelberg], Pages: 1-14
Physical, Chemical, and Electrical Characterization of High-κ Dielectrics on Ge and GaAs
Advanced Gate Stacks for High-Mobility Semiconductors [Springer, Berlin, Heidelberg], Pages: 181-209
CEMS characterisation of Fe/high-κ oxide interfaces
ICAME 2005 [Springer, Berlin, Heidelberg], Pages: 1349-1353
Low temperature CEMS of Sn-implanted SiO2
ICAME 2005 [Springer, Berlin, Heidelberg], Pages: 69-73
Low temperature CEMS of Sn-implanted SiO 2
ICAME 2005 [Springer, Berlin, Heidelberg], Pages: 69-73
Defects in High-k Gate Dielectric Stacks [Springer, Dordrecht], Pages: 147-160
Experimental Determination of the Band Offset of Rare Earth Oxides on Various Semiconductors
Rare Earth Oxide Thin Films [],
DEFECTS AT THE HIGH-κ/SEMICONDUCTOR INTERFACES INVESTIGATED BY SPIN DEPENDENT SPECTROSCOPIES
Defects in High-k Gate Dielectric Stacks [Springer, Dordrecht], Pages: 263-276
Film and Interface Layer Compositionof Rare Earth (Lu, Yb) Oxides Depositedby ALD
Rare Earth Oxide Thin Films [Springer, Berlin, Heidelberg], Pages: 127-142
Formation of Fe i− B pairs in silicon at high temperatures
ICAME 2005 [Springer, Berlin, Heidelberg], Pages: 1315-1318
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials [Springer, Dordrecht], Pages: 405-411
Thin-film Engineering by Atomic-layer Deposition for Ultra-scaled and Novel Devices
Materials for Information Technology [Springer, London], Pages: 31-38
Resonant Raman microscopy of stress in silicon-based microelectronics
Microscopy of Semiconducting Materials [Springer, Berlin, Heidelberg], Pages: 371-374