Transmission electron microscopy provides a wide range of methods to study the morphology, the crystal structure and perfection, the chemistry, and the magnetic and the electronic properties of the matter at the highest spatial resolution. In this chapter some TEM approaches to study nanostructured semiconductors will be described with the help of practical examples of their application to different kinds of material systems.
Springer, Berlin, Heidelberg
1 Jan 2014
Transmission Electron Microscopy Characterization of Nanomaterials