2023 | IMM Container

Nanostructure and phase engineering of manganese oxide thin films grown by pulsed laser deposition: A Raman and XRD study

Andrea Macrelli, Arianna Monforte Ferrario, Alessio Lamperti, Alberto Calloni, Valeria Russo, Carlo S Casari, Andrea Li Bassi

2023-08-25

Biblio references: Volume: 7 Issue: 8 Pages: 083403

Origin: Physical Review Materials

Field-driven attosecond charge dynamics in germanium

Giacomo Inzani, Lyudmyla Adamska, Amir Eskandari-asl, Nicola Di Palo, Gian Luca Dolso, Bruno Moio, Luciano Jacopo D’Onofrio, Alessio Lamperti, Alessandro Molle, Rocío Borrego-Varillas, Mauro Nisoli, Stefano Pittalis, Carlo Andrea Rozzi, Adolfo Avella, Matteo Lucchini

2023-08-24

Biblio references: Pages: 1-7

Origin: Nature Photonics

Native Silicon Oxide Properties Determined by Doping

Michele Della Ciana, Alessandro Kovtun, Caterina Summonte, Andrea Candini, Daniela Cavalcoli, Denis Gentili, Roberta Nipoti, Cristiano Albonetti

2023-08-23

Biblio references: Volume: 39 Issue: 35 Pages: 12430-12451

Origin: Langmuir

Parameter space geometry of the quartic oscillator and the double well potential: Classical and quantum description

Diego Gonzalez, Jorge Chávez-Carlos, Jorge G Hirsch, J David Vergara

2023-08-23

Biblio references:

Origin: arXiv preprint arXiv:2308.11848

Acoustic Waves in Piezoelectric Layered Structure for Selective Detection of Liquid Viscosity

Andrey Smirnov, Vladimir Anisimkin, Elizaveta Shamsutdinova, Maria-Assunta Signore, Luca Francioso, Kirill Zykov, Vladimir Baklaushev, Iren Kuznetsova

2023-08-22

Biblio references: Volume: 23 Issue: 17 Pages: 7329

Origin: Sensors

Low Frequency Noise in DNTT/Cytop™ based Organic Thin Film Transistors

G Giusi, M Rapisarda, M Scagliotti, L Mariucci, G Scandurra, C Ciofi

2023-08-22

Biblio references:

Origin: IEEE Electron Device Letters

Anodic Stripping Voltammetric Determination of Copper Ions in Cell Culture Media: From Transwell® to Organ-on-Chip Systems

Carmela Tania Prontera, Elisa Sciurti, Chiara De Pascali, Lucia Giampetruzzi, Francesco Biscaglia, Laura Blasi, Vanessa Esposito, Flavio Casino, Pietro Aleardo Siciliano, Luca Nunzio Francioso

2023-08-21

Biblio references: Volume: 11 Issue: 8 Pages: 466

Origin: Chemosensors

Reconfigurable THz fixed-frequency beamscanning through a liquid-crystal-loaded leaky waveguide operating in its fundamental TE mode

Walter Fuscaldo, Elahehsadat Torabi, Dimitrios C Zografopoulos, Danilo Erricolo, Romeo Beccherelli

2023-08-21

Biblio references:

Origin: IEEE Access

Al2O3 Layers Grown by Atomic Layer Deposition as Gate Insulator in 3C-SiC MOS Devices

Emanuela Schilirò, Patrick Fiorenza, Raffaella Lo Nigro, Bruno Galizia, Giuseppe Greco, Salvatore Di Franco, Corrado Bongiorno, Francesco La Via, Filippo Giannazzo, Fabrizio Roccaforte

2023-08-15

Biblio references: Volume: 16 Issue: 16 Pages: 5638

Origin: Materials

Electrical characterization of thin silicon-on-insulator films doped by means of phosphorus end-terminated polymers

Andrea Pulici, Stefano Kuschlan, Gabriele Seguini, Fabiana Taglietti, Marco Fanciulli, Riccardo Chiarcos, Michele Laus, Michele Perego

2023-08-15

Biblio references: Volume: 163 Pages: 107548

Origin: Materials Science in Semiconductor Processing

Nanostructure and phase engineering of manganese oxide thin films grown by pulsed laser deposition: A Raman and XRD study

Field-driven attosecond charge dynamics in germanium

Native Silicon Oxide Properties Determined by Doping

Parameter space geometry of the quartic oscillator and the double well potential: Classical and quantum description

Acoustic Waves in Piezoelectric Layered Structure for Selective Detection of Liquid Viscosity

Low Frequency Noise in DNTT/Cytop™ based Organic Thin Film Transistors

Anodic Stripping Voltammetric Determination of Copper Ions in Cell Culture Media: From Transwell® to Organ-on-Chip Systems

Reconfigurable THz fixed-frequency beamscanning through a liquid-crystal-loaded leaky waveguide operating in its fundamental TE mode

Al2O3 Layers Grown by Atomic Layer Deposition as Gate Insulator in 3C-SiC MOS Devices

Electrical characterization of thin silicon-on-insulator films doped by means of phosphorus end-terminated polymers

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