Andrei Zenkevich, Yu Lebedinskii, G Scarel, Marco Fanciulli, Andrey Baturin, N Lubovin
Biblio references: Volume: 47 Issue: 4-5 Pages: 657-659
Origin: Microelectronics Reliability
R De Bastiani, AM Piro, MG Grimaldi, E Rimini
Biblio references: Volume: 257 Issue: 1-2 Pages: 572-576
Origin: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
L Sirleto, M Iodice, FG Della Corte, I Rendina
Biblio references: Volume: 45 Issue: 4 Pages: 458-462
Origin: Optics and lasers in engineering
G Neri, A Bonavita, G Rizzo, S Galvagno, N Pinna, M Niederberger, S Capone, P Siciliano
Biblio references: Volume: 122 Issue: 2 Pages: 564-571
Origin: Sensors and Actuators B: Chemical
A Marino, G Abbate, V Tkachenko, I Rea, L De Stefano, M Giocondo
Biblio references: Volume: 465 Issue: 1 Pages: 359-370
Origin: Molecular Crystals and Liquid Crystals
Romeo Beccherelli, Bob Bellini, Domenico Donisi, Antonio d'Alessandro
Biblio references: Volume: 465 Issue: 1 Pages: 249-257
Domenico Donisi, Antonio d'Alessandro, Rita Asquini, Romeo Beccherelli
Biblio references: Volume: 465 Issue: 1 Pages: 227-237
RK Debnath, R Meijers, T Richter, T Stoica, R Calarco, H Lüth
Biblio references: Volume: 90 Issue: 12 Pages: 123117
Origin: Applied Physics Letters
Luigi Mariucci, Paolo Gaucci, Antonio Valletta, François Templier, Guglielmo Fortunato
Biblio references: Volume: 46 Issue: 3S Pages: 1299
Origin: Japanese journal of applied physics
AM Mazzone, R Rizzoli
Biblio references: Volume: 253 Issue: 10 Pages: 4537-4541
Origin: Applied surface science
