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Two different original theoretical approach for the analysis of vapour sensors based on a porous silicon optical microcavity are presented. The devices under analysis are based on a cavity with a high porosity layer of optical thickness λB/2, where λB is the Bragg resonant wavelength. This is enclosed between two distributed Bragg reflectors with seven periods made of alternate low and high porosity layers. When such a porous silicon microcavity is exposed to chemical vapours, a marked red-shift of its resonant peak, ascribed to capillary condensation of vapour in the pores, is observed. According to the first approach, the features of porous silicon microcavities are analyzed looking at the correspondent band structure. In particular, the microcavity structure is viewed as a 1-D photonic crystal with a defect of optical thickness λB/2 giving rise to a narrow resonant transmittance peak at λB in a wide transmittivity stop …
International Society for Optics and Photonics
Publication date: 
13 Apr 2005
Biblio References: 
Volume: 5733 Pages: 316-323
Photonic Crystal Materials and Devices III