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This paper reports on a conductive atomic force microscopy (C-AFM) investigation to provide local electrical characterization in a single crystal of CaCu 3 Ti 4 O 12 (CCTO). The microstructure and dielectric properties were studied and provide evidence for an insulating secondary phase embedded within the semiconducting CCTO matrix. Such insulating electrical heterogeneities cannot be observed with macroscopic measurements such as conventional Impedance Spectroscopy and this study reveals C-AFM to be a powerful tool to assess the electrical homogeneity of semiconducting single crystals such as CCTO.
IOP Publishing
Publication date: 
1 Jan 2010

Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri, Stephan Krohns, Peter Lunkenheimer, Alois Loidl, Stefan G Ebbinghaus, Matthew C Ferrarelli, Derek C Sinclair, Anthony R West

Biblio References: 
Volume: 8 Issue: 1 Pages: 012018
IOP Conference Series: Materials Science and Engineering