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Synthesis of a Metasurface-based Bessel Beam Launcher at Microwaves and Millimeter Waves

Santi C Pavone, Walter Fuscaldo

2022-03-27

Biblio references: Pages: 1-3

Origin: 2022 16th European Conference on Antennas and Propagation (EuCAP)
Refractive index sensing by all-dielectric metasurfaces supporting quasi-bound states in the continuum

Mohsen Samadi, Fatemeh Abshari, JF Algorri, P Roldán-Varona, L Rodríguez-Cobo, JM López-Higuera, JM Sánchez-Pena, DC Zografopoulos, F Dell'Olio

2022-03-04

Biblio references: Volume: 11987 Pages: 82-87

Origin: Laser Resonators, Microresonators, and Beam Control XXIV
Double electromagnetically induced transparency resonance in slotted metasurfaces supporting bound states in the continuum

JF Algorri, F Dell'Olio, P Roldán-Varona, L Rodríguez-Cobo, JM López-Higuera, JM Sánchez-Pena, DC Zografopoulos

2022-03-04

Biblio references: Pages: 1-2

Origin: 2022 Workshop on Recent Advances in Photonics (WRAP)
Electrical Scanning Probe Microscopy Investigation of Schottky and Metal-Oxide Junctions on Hetero-Epitaxial 3C-SiС on Silicon

Filippo Giannazzo, Patrick Fiorenza, E Schiliro, Salvatore Di Franco, Sylvain Monnoye, Hugues Mank, Marcin Zielinski, Francesco La Via, Fabrizio Roccaforte

2022-01-01

Biblio references: Volume: 1062 Pages: 400-405

Origin: Materials Science Forum
High Temperature Etching for Threading Dislocation Investigation on GaN Epi-Layer

Ruggero Anzalone, Giuseppe Greco, Fabrizio Roccaforte, Patrick Fiorenza, Nicolò Piluso, Andrea Severino

2022-01-01

Biblio references: Volume: 1062 Pages: 18-22

Origin: Materials Science Forum
Review of Sublimation Growth of SiC Bulk Crystals

Peter J Wellmann, Matthias Arzig, Jonas Ihle, Manuel Kollmuss, Johannes Steiner, Marco Mauceri, Danilo Crippa, Francesco La Via, Michael Salamon, Norman Uhlmann, Melissa Roder, Andreas N Danilewsky, Binh Duong Nguyen, Stefan Sandfeld

2022-01-01

Biblio references: Volume: 1062 Pages: 104-112

Origin: Materials Science Forum
Charge Trapping Mechanisms in Nitridated SiO2/4H-SiC MOSFET Interfaces: Threshold Voltage Instability and Interface Chemistry

Patrick Fiorenza, Corrado Bongiorno, A Messina, Mario Saggio, Filippo Giannazzo, Fabrizio Roccaforte

2022-01-01

Biblio references: Volume: 1062 Pages: 160-164

Origin: Materials Science Forum
Effect of N and Al Doping on 3C-SiC Stacking Faults

Cristiano Calabretta, Viviana Scuderi, Ruggero Anzalone, Annalisa Cannizzaro, Marco Mauceri, Danilo Crippa, Simona Boninelli, Francesco La Via

2022-01-01

Biblio references: Volume: 1062 Pages: 64-68

Origin: Materials Science Forum
Structural and Electrical Characterization of Ni-Based Ohmic Contacts on 4H-SiC Formed by Solid-State Laser Annealing

Paolo Badalà, Emanuele Smecca, Simone Rascunà, Corrado Bongiorno, Egidio Carria, Anna Bassi, Gabriele Bellocchi, Silvia Castorina, Cristina Tringali, Antonino La Magna, Alessandra Alberti

2022-01-01

Biblio references: Volume: 1062 Pages: 417-421

Origin: Materials Science Forum
Automatic Image Analysis of Stackingfault

Annamaria Muoio, Cristiano Calabretta, Viviana Scuderi, Massimo Zimbone, Francesco La Via

2022-01-01

Biblio references: Volume: 1062 Pages: 283-287

Origin: Materials Science Forum

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