2022 | IMM Container

Automatic Image Analysis of Stackingfault

Annamaria Muoio, Cristiano Calabretta, Viviana Scuderi, Massimo Zimbone, Francesco La Via

2022-01-01

Biblio references: Volume: 1062 Pages: 283-287

Origin: Materials Science Forum

Clinical Decision Support System for Multisensory Stimulation Therapy in Dementia: A Preliminary Study

Giovanni Diraco, Alessandro Leone, Pietro Siciliano

2022-01-01

Biblio references: Pages: 315-334

Origin: Italian Forum of Ambient Assisted Living

Integrated Measurement and Management System for Sarcopenia Diagnosis

Luigi Accetta, Filomena Addante, Andrea Caroppo, Francesco Ciliberti, Francesco Giusto, Alessandro Leone, Luigi Patrono, Gabriele Rescio, Ilaria Sergi, Daniele Sancarlo

2022-01-01

Biblio references: Pages: 249-258

Origin: Italian Forum of Ambient Assisted Living

Large Area Growth of Cubic Silicon Carbide Using Close Space PVT by Application of Homoepitaxial Seeding

Manuel Kollmuss, Michael Schöler, Ruggero Anzalone, Marco Mauceri, Francesco La Via, Peter J Wellmann

2022-01-01

Biblio references: Volume: 1062 Pages: 74-78

Origin: Materials Science Forum

Plasmon resonances in silicon quantum wires

Giovanni Borgh, Antonino La Magna, Giovanni Mannino, Alireza Shabani, Salvatore Patanè, Jost Adam, Rosaria Puglisi

2022-01-01

Biblio references:

Origin: European Materials Research Society (E-MRS) 2022-Fall Meeting

Effect of N and Al Doping on 3C-SiC Stacking Faults

Cristiano Calabretta, Viviana Scuderi, Ruggero Anzalone, Annalisa Cannizzaro, Marco Mauceri, Danilo Crippa, Simona Boninelli, Francesco La Via

2022-01-01

Biblio references: Volume: 1062 Pages: 64-68

Origin: Materials Science Forum

High Temperature Etching for Threading Dislocation Investigation on GaN Epi-Layer

Ruggero Anzalone, Giuseppe Greco, Fabrizio Roccaforte, Patrick Fiorenza, Nicolò Piluso, Andrea Severino

2022-01-01

Biblio references: Volume: 1062 Pages: 18-22

Origin: Materials Science Forum

Review of Sublimation Growth of SiC Bulk Crystals

Peter J Wellmann, Matthias Arzig, Jonas Ihle, Manuel Kollmuss, Johannes Steiner, Marco Mauceri, Danilo Crippa, Francesco La Via, Michael Salamon, Norman Uhlmann, Melissa Roder, Andreas N Danilewsky, Binh Duong Nguyen, Stefan Sandfeld

2022-01-01

Biblio references: Volume: 1062 Pages: 104-112

Origin: Materials Science Forum

Mechanism Governing Surface Roughening of Al Ion Implanted 4H-SiC during Annealing under a C-Cap

Mariaconcetta Canino, Fulvio Mancarella, Filippo Bonafè, Franco Corticelli, Cristiano Albonetti, Roberta Nipoti

2022-01-01

Biblio references: Volume: 1062 Pages: 235-240

Origin: Materials Science Forum

Charge Trapping Mechanisms in Nitridated SiO2/4H-SiC MOSFET Interfaces: Threshold Voltage Instability and Interface Chemistry

Patrick Fiorenza, Corrado Bongiorno, A Messina, Mario Saggio, Filippo Giannazzo, Fabrizio Roccaforte

2022-01-01

Biblio references: Volume: 1062 Pages: 160-164

Origin: Materials Science Forum

Automatic Image Analysis of Stackingfault

Clinical Decision Support System for Multisensory Stimulation Therapy in Dementia: A Preliminary Study

Integrated Measurement and Management System for Sarcopenia Diagnosis

Large Area Growth of Cubic Silicon Carbide Using Close Space PVT by Application of Homoepitaxial Seeding

Plasmon resonances in silicon quantum wires

Effect of N and Al Doping on 3C-SiC Stacking Faults

High Temperature Etching for Threading Dislocation Investigation on GaN Epi-Layer

Review of Sublimation Growth of SiC Bulk Crystals

Mechanism Governing Surface Roughening of Al Ion Implanted 4H-SiC during Annealing under a C-Cap

Charge Trapping Mechanisms in Nitridated SiO2/4H-SiC MOSFET Interfaces: Threshold Voltage Instability and Interface Chemistry

Pages

Scientific Productions

Units in Italy

Contact info

Link Utili

You are here

Pages

Scientific Productions

Units in Italy

Contact info

Link Utili