Andrea Caroppo, Alessandro Leone, Pietro Siciliano
Biblio references: Pages: 313-321
Origin: AISEM Annual Conference on Sensors and Microsystems
Virginia Di Carlo, Fabio Marzo, Massimo Di Giulio, Paola Prete, Nico Lovergine
Biblio references: Pages: 279-288
L Francioso, G Malucelli, A Fioravanti, C De Pascali, MA Signore, MC Carotta, A Bonanno, D Duraccio
Biblio references: Pages: 323-330
A Forleo, S Capone, V Longo, F Casino, AV Radogna, P Siciliano, M Massaro, E Scoditti, N Calabriso, MA Carluccio
Biblio references: Pages: 269-277
Carlo De Santi, Matteo Meneghini, Nicola Renso, Matteo Buffolo, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Andrea Migliori, Vittorio Morandi, Gaudenzio Meneghesso, Enrico Zanoni
Biblio references: Volume: 10124 Pages: 101240F
Origin: Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXI
Alessandra Aloisi, Chiara Cristina Toma, Giulia Della Rosa, Benedetta Raganato, Riccardo Di Corato, Stefania Cicco, Danilo Vona, Roberta Ragni, Gianluca Farinola, Ross Rinaldi
Biblio references:
Origin: AISEM 2017
C Carbone, E Cozzani, N Zanca, S Zampolli, F Manarini, MC Pietrogrande, A Lupi, M Busetto, A Poggi, S Fuzzi, S Decesari
Biblio references: Pages: 0-0
Origin: EAC 2017
Oleg Mitrofanov, Leonardo Viti, Maria Caterina Giordano, Enrico Dardanis, Daniele Ercolani, Antonio Politano, Lucia Sorba, Miriam S Vitiello
Biblio references: Pages: 1-2
Origin: 2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
S Mirabella, IP Oliveri, F Ruffino, G Maccarrone, S Di Bella
Biblio references: Pages: V. 3.7.
Origin: Symposium V-Design and hierarchical assemblies of nanomaterials (nanoparticles, carbon materials, molecules) towards energy, sensing, electronic, catalysis and detection applications
Romolo Marcelli, Andrea Lucibello, Giovanni Capoccia, Emanuela Proietti, Giovanni Maria Sardi, Christopher Hardly Joseph, Loukas Michalas, Giancarlo Bartolucci, Ferry Kienberger, Georg Gramse, Manuel Kasper
Biblio references: Pages: 29-36
Origin: 2017 International Semiconductor Conference (CAS)
