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Y2−xErxO3 thin films, with x varying between 0 and 0.72, have been successfully grown on crystalline silicon (c-Si) substrates by radio-frequency magnetron cosputtering of Y2O3 and Er2O3 targets. As-deposited films are polycrystalline, showing the body-centered cubic structure of Y2O3, and show only a slight lattice parameter contraction when x is increased, owing to the insertion of Er ions. All the films exhibit intense Er-related optical emission at room temperature both in the visible and infrared regions. By studying the optical properties for different excitation conditions and for different Er contents, all the mechanisms (i.e., cross relaxations, up-conversions, and energy transfers to impurities) responsible for the photoluminescence (PL) emission have been identified, and the existence of two different well-defined Er concentration regimes has been demonstrated. In the low concentration regime (x up to 0.05, Er …
American Institute of Physics
Publication date: 
15 Aug 2009

R Lo Savio, M Miritello, P Cardile, F Priolo

Biblio References: 
Volume: 106 Issue: 4 Pages: 043512
Journal of Applied Physics