K Bharuth-Ram, HP Gunnlaugsson, R Mantovan, VV Naicker, D Naidoo, R Sielemann, G Weyer, Th Aigne, ISOLDE Collaboration
Biblio references: Pages: 621-625
Origin: ICAME 2007
V Grillo, F Glas, E Carlino
Biblio references: Pages: 95-96
Origin: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
G NERI, A BONAVITA, G RIZZO, S GALVAGNO, N PINNA, M NIEDERBERGER, S CAPONE, P SICILIANO
Biblio references: Pages: 236-241
Origin: Sensors And Microsystems
W Vastarella, M ILIE, L NARDI, A MASCI, R PILLOTON, E Cianci, S QUARESIMA, A COPPA, V FOGLIETTI
Biblio references: Pages: 312-316
V Morandi, A Migliori, P Maccagnani, M Ferroni, F Tamarri
Biblio references: Pages: 581-582
M CONSALES, A CRESCITELLI, A CUTOLO, A CUSANO, S CAMPOPIANO, M PENZA, P AVERSA, M GIORDANO
Biblio references: Pages: 229-235
M Casalino, L Sirleto, L Moretti, F Della Corte, I Rendina
Biblio references: Pages: 448-457
E Carlino, V Grillo, P Palazzari
Biblio references: Pages: 177-180
Origin: Microscopy of Semiconducting Materials 2007
F Siviero, N Coppedè, L Aversa, M Nardi, A Pallaoro, T Toccoli, R Verucchi, S Iannotta, AM Taurino, P Siciliano
Biblio references: Pages: 257-261
Andrea Baschirotto, Enrico Melissano, Pietro Siciliano, Enrico Dallago, Piero Malcovati, Marco Marchesi, Giuseppe Venchi
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