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The effects of boundary conditions on dopant region imaging in scanning electron microscopy

M Ferroni, PG Merli, V Morandi

2005-01-01

Biblio references: Pages: 475-478

Origin: Microscopy of Semiconducting Materials
ELECTRONIC NOSE, HS-SPME/GC/MS AND PANEL TEST CORRELATION FOR MONO–CULTIVAR EXTRA-VIRGIN OLIVE OILS

D Dello Monaco, C Distante, DS Presicce, P Siciliano, AM Taurino, M Zuppa, A CIMATO, G SANI

2005-01-01

Biblio references: Pages: 128-133

Origin: Sensors And Microsystems
SELECTIVE MONITORING OF INDOOR VOC AT PPB LEVEL

S ZAMPOLLI, I ELMI, S NICOLETTI, L DORI, GC CARDINALI, J STÜRMANN

2005-01-01

Biblio references: Pages: 356-363

Origin: Sensors And Microsystems

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