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Type: 
Journal
Description: 
Publisher: 
Springer Science & Business Media
Publication date: 
27 Jan 2006
Authors: 

SIMONE COCCO BALDOVINO, GABRIELE SEGUINI, ENRICO PRATI, GIOVANNA SCAREL

Biblio References: 
Pages: 263
Origin: 
Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices