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We have investigated the F incorporation and segregation in preamorphized Si during solid phase epitaxy (SPE) at different temperatures and for several implanted-F energies and fluences. The Si samples were amorphized to a depth of 550 nm by implanting Si at liquid nitrogen temperature and then enriched with F at different energies (65–150 keV) and fluences (0.07–5 × 1014 F/cm2). Subsequently, the samples were regrown by SPE at different temperatures: 580, 700 and 800 °C. We have found that the amount of F incorporated after SPE strongly depends on the SPE temperature and on the energy and fluence of the implanted-F, opening the possibility to tailor the F profile during SPE.
Publication date: 
1 Jan 2006

G Impellizzeri, S Mirabella, L Romano, E Napolitani, A Carnera, MG Grimaldi, F Priolo

Biblio References: 
Volume: 242 Issue: 1-2 Pages: 614-616
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms