Type:
Conference
Description:
This paper reports on the electrical characteristics of silicon photomultipliers (SiPM) with optimized optical trench technology. The SiPM arrays were characterized from single pixels up to the full 64×64 pixel device. The data clearly show a perfect scaling of the dark current with the pixel number, thus indicating an almost ideal insulation among the pixels in the whole voltage operating range.
Publisher:
IEEE
Publication date:
12 Sep 2011
Biblio References:
Pages: 183-186
Origin:
2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC)